{"@context":"http://schema.org","@type":"Dataset","@id":"https://doi.org/10.34820/FK2/PVWSJ0","identifier":"https://doi.org/10.34820/FK2/PVWSJ0","name":"Replication Data for: Dataset for electronic nose from various beef cuts","creator":[{"name":"Wijaya, Dedy Rahman","affiliation":"Telkom University","@id":"https://orcid.org/0000-0003-0351-7331","identifier":"https://orcid.org/0000-0003-0351-7331"}],"author":[{"name":"Wijaya, Dedy Rahman","affiliation":"Telkom University","@id":"https://orcid.org/0000-0003-0351-7331","identifier":"https://orcid.org/0000-0003-0351-7331"}],"datePublished":"2022-03-22","dateModified":"2022-03-22","version":"1","description":["This dataset is originated from 12 type of beef cuts including round (shank), top sirloin, tenderloin, flap meat (flank), striploin (shortloin), brisket, clod/chuck, skirt meat (plate), inside/outside, rib eye, shin, and fat. The process of beef spoilage is recorded using 11 Metal-Oxide Semiconductor (MOS) gas sensors during 2220 minutes. The dataset is formatted in \"xlsx\" file. Each sheet represents one beef cut which is contained columns as follows: Minute: time in minute TVC: continuous label in the total viable count Label: discrete label, 1,2,3,4 denote “excellent”,”good”,”acceptable”, and “spoiled”, respectively. MQ_: the resistant value of gas sensors"],"keywords":["Computer and Information Science","electronic nose","signal processing","beef quality","classification","regression"],"license":{"@type":"Dataset","text":"CC0","url":"https://creativecommons.org/publicdomain/zero/1.0/"},"includedInDataCatalog":{"@type":"DataCatalog","name":"Telkom University Dataverse","url":"https://dataverse.telkomuniversity.ac.id"},"publisher":{"@type":"Organization","name":"Telkom University Dataverse"},"provider":{"@type":"Organization","name":"Telkom University Dataverse"},"distribution":[{"@type":"DataDownload","name":"e-nose_dataset_12_beef_cuts.tab","fileFormat":"text/tab-separated-values","contentSize":196033,"@id":"https://doi.org/10.34820/FK2/PVWSJ0/UVMBZE","identifier":"https://doi.org/10.34820/FK2/PVWSJ0/UVMBZE","contentUrl":"https://dataverse.telkomuniversity.ac.id/api/access/datafile/4420"}]}